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GLVLSI
2000
IEEE

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Measuring routing congestion for multi-layer global routing

16 years 4 days ago

Measuring routing congestion for multi-layer global routing

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Tom W. Chen, Alkan Cengiz

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GLVLSI 2000 | VLSI |

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Added	31 Jul 2010
Updated	31 Jul 2010
Type	Conference
Year	2000
Where	GLVLSI
Authors	Tom W. Chen, Alkan Cengiz

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