185
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ITC
16 years 2 days ago
1989 IEEE 
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
162
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ITC
16 years 2 days ago
1989 IEEE 
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
152
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ITC
16 years 2 days ago
1989 IEEE  |
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