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IOLTS
2006
IEEE
101views Hardware» more  IOLTS 2006»
16 years 2 days ago
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury,...
ISORC
2006
IEEE
16 years 2 days ago
Automatic Memory Management in Utility Accrual Scheduling Environments
Convenience, reliability, and effectiveness of automatic memory management have long been established in modern systems and programming languages such as Java. The timeliness req...
Shahrooz Feizabadi, Godmar Back
ISORC
2006
IEEE
16 years 2 days ago
Dynamically Deploying Web Services on a Grid using Dynasoar
Dynasoar is an infrastructure for dynamically deploying Web Services over a Grid or the Internet. It enables an approach to Grid computing in which distributed applications are bu...
Paul Watson, Chris Fowler, Charles Kubicek, Arijit...
ISORC
2006
IEEE
16 years 2 days ago
RTSTREAM: Real-Time Query Processing for Data Streams
Many real-time applications, such as traffic control systems, surveillance systems and health monitoring systems, need to operate on continuous unbounded streams of data. These ap...
Yuan Wei, Sang Hyuk Son, John A. Stankovic
ISSRE
2006
IEEE
16 years 2 days ago
BPEL4WS Unit Testing: Test Case Generation Using a Concurrent Path Analysis Approach
BPEL is a language that could express complex concurrent behaviors. This paper presents a novel method of BPEL test case generation, which is based on concurrent path analysis. Th...
Jun Yan, Zhong Jie Li, Yuan Yuan, Wei Sun, Jian Zh...
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