465 search results - page 27 / 93 » A New Approach for Low Power Scan Testing |
138
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JIIS
2006
15 years 4 months ago
2006
In recent years, emerging applications introduced new constraints for data mining methods. These constraints are typical of a new kind of data: the data streams. In data stream pro...
123
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ITC
1997
IEEE
15 years 8 months ago
1997
IEEE
Testing embedded cores is a challenge because access to core I/Os is limited. The user-defined logic (ZJDL) surrounding the core may restrict the set of test vectors that can be a...
145
Voted
VLSID
2001
IEEE
16 years 4 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
146
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TVLSI
2008
15 years 3 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
137
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ISM
2008
IEEE
15 years 10 months ago
2008
IEEE
Selective encryption is a new trend in content protection. It aims at reducing the amount of data to encrypt while achieving a sufficient and inexpensive security. This approach ...