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ECLIPSE
2007
ACM
15 years 1 months ago
UnitPlus: assisting developer testing in Eclipse
In the software development life cycle, unit testing is an important phase that helps in early detection of bugs. A unit test case consists of two parts: a test input, which is of...
Yoonki Song, Suresh Thummalapenta, Tao Xie
DAC
1999
ACM
15 years 1 months ago
IC Test Using the Energy Consumption Ratio
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
Wanli Jiang, Bapiraju Vinnakota
ICSE
2007
IEEE-ACM
15 years 9 months ago
Using GUI Run-Time State as Feedback to Generate Test Cases
This paper presents a new automated model-driven technique to generate test cases by using feedback from the execution of a "seed test suite" on an application under tes...
Xun Yuan, Atif M. Memon
DFT
2006
IEEE
148views VLSI» more  DFT 2006»
14 years 11 months ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
Lei Fang, Michael S. Hsiao
JIPS
2010
160views more  JIPS 2010»
14 years 4 months ago
A Regression Test Selection and Prioritization Technique
Regression testing is a very costly process performed primarily as a software maintenance activity. It is the process of retesting the modified parts of the software and ensuring t...
Ruchika Malhotra, Arvinder Kaur, Yogesh Singh