70 search results - page 10 / 14 » A Test Pattern Generation Methodology for Low-Power Consumpt... |
ITC
2003
IEEE
15 years 7 months ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
102
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DAC
2007
ACM
16 years 2 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
116
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SIMPRA
2010
15 years 6 days ago
2010
We have developed an individual-based evolving predator-prey ecosystem simulation that integrates, for the first time, a complex individual behaviour model, an evolutionary mecha...
108
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ITC
1999
IEEE
15 years 6 months ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
84
Voted
WSC
2004
15 years 3 months ago
2004
Computer-based business analysis relies on models, or algorithmic representations of the business process. Real-life business problems can become very complex, which creates diffi...