70 search results - page 10 / 14 » A Test Pattern Generation Methodology for Low-Power Consumpt... |
ITC
2003
IEEE
15 years 4 months ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
DAC
2007
ACM
16 years 19 days ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
103
Voted
SIMPRA
2010
14 years 10 months ago
2010
We have developed an individual-based evolving predator-prey ecosystem simulation that integrates, for the first time, a complex individual behaviour model, an evolutionary mecha...
ITC
1999
IEEE
15 years 3 months ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
WSC
2004
15 years 1 months ago
2004
Computer-based business analysis relies on models, or algorithmic representations of the business process. Real-life business problems can become very complex, which creates diffi...