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DFT
2002
IEEE
108views VLSI» more  DFT 2002»
15 years 2 months ago
A Test-Vector Generation Methodology for Crosstalk Noise Faults
Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park
DAC
2000
ACM
15 years 10 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
15 years 3 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
ITC
2003
IEEE
148views Hardware» more  ITC 2003»
15 years 2 months ago
HyAC: A Hybrid Structural SAT Based ATPG for Crosstalk
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
Xiaoliang Bai, Sujit Dey, Angela Krstic
ET
2002
97views more  ET 2002»
14 years 9 months ago
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer