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» A Three-Phase Algorithm for Computer Aided siRNA Design
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DAC
2007
ACM
16 years 3 months ago
Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation
We present an efficient technique for finding the mean and variance of the full-chip leakage of a candidate design, while considering logic-structures and both die-to-die and with...
Khaled R. Heloue, Navid Azizi, Farid N. Najm
DAC
2005
ACM
16 years 3 months ago
Diffusion-based placement migration
Placement migration is the movement of cells within an existing placement to address a variety of post-placement design closure issues, such as timing, routing congestion, signal ...
Haoxing Ren, David Zhigang Pan, Charles J. Alpert,...
131
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GLVLSI
2006
IEEE
165views VLSI» more  GLVLSI 2006»
15 years 8 months ago
Block alignment in 3D floorplan using layered TCG
In modern IC design, the number of long on-chip wires has been growing rapidly because of the increasing circuit complexity. Interconnect delay has dominated over gate delay as te...
Jill H. Y. Law, Evangeline F. Y. Young, Royce L. S...
DAC
2004
ACM
16 years 3 months ago
STAC: statistical timing analysis with correlation
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
Jiayong Le, Xin Li, Lawrence T. Pileggi
SLIP
2009
ACM
15 years 9 months ago
Integrated interlayer via planning and pin assignment for 3D ICs
As technology advances, 3D ICs are introduced for alleviating the interconnect problem coming with shrinking feature size and increasing integration density. In 3D ICs, one of the...
Xu He, Sheqin Dong, Xianlong Hong, Satoshi Goto