We present an efficient technique for finding the mean and variance of the full-chip leakage of a candidate design, while considering logic-structures and both die-to-die and with...
Placement migration is the movement of cells within an existing placement to address a variety of post-placement design closure issues, such as timing, routing congestion, signal ...
Haoxing Ren, David Zhigang Pan, Charles J. Alpert,...
In modern IC design, the number of long on-chip wires has been growing rapidly because of the increasing circuit complexity. Interconnect delay has dominated over gate delay as te...
Jill H. Y. Law, Evangeline F. Y. Young, Royce L. S...
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
As technology advances, 3D ICs are introduced for alleviating the interconnect problem coming with shrinking feature size and increasing integration density. In 3D ICs, one of the...