28 search results - page 4 / 6 » A Unified Approach for SOC Testing Using Test Data Compressi... |
VTS
2003
IEEE
13 years 11 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
ICCD
1999
IEEE
13 years 10 months ago
1999
IEEE
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
TVLSI
2010
13 years 1 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
ET
2002
13 years 6 months ago
2002
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...
DSD
2010
IEEE
13 years 6 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...