119 search results - page 15 / 24 » A low power switching power supply for self-clocked systems |
VLSID
2002
IEEE
15 years 9 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
TVLSI
2008
14 years 9 months ago
2008
Decoupling capacitors are widely used to reduce power supply noise. On-chip decoupling capacitors have traditionally been allocated into the white space available on a die or place...
MICRO
2006
IEEE
15 years 3 months ago
2006
IEEE
Power delivery is a growing reliability concern in microprocessors as the industry moves toward feature-rich, powerhungrier designs. To battle the ever-aggravating power consumpti...
HAPTICS
2009
IEEE
15 years 4 months ago
2009
IEEE
We present a tactile Respiratory Management System (tRMS) to manage and control breathing patterns of cancer patients undergoing radiation therapy. The system comprises of an arra...
HYBRID
2009
Springer
15 years 4 months ago
2009
Springer
In this paper, we analyze the problem of finding a periodic schedule for the wake-up times of a set of nodes in a Wireless Sensor Network that optimizes the coverage of the region...