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DATE
2010
IEEE
161views Hardware» more  DATE 2010»
15 years 5 months ago
BISD: Scan-based Built-In self-diagnosis
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
Melanie Elm, Hans-Joachim Wunderlich
APSEC
2002
IEEE
15 years 4 months ago
A Predictive Performance Model to Evaluate the Contention Cost in Application Servers
In multi-tier enterprise systems, application servers are key components to implement business logic and provide services. To support a large number of simultaneous accesses from ...
Shiping Chen, Ian Gorton
CSFW
2002
IEEE
15 years 4 months ago
Secrecy in Multiagent Systems
We introduce a general framework for reasoning about secrecy requirements in multiagent systems. Because secrecy requirements are closely connected with the knowledge of individua...
Joseph Y. Halpern, Kevin R. O'Neill
DELTA
2002
IEEE
15 years 4 months ago
Teaching Integrated Circuit and Semiconductor Device Design in New Zealand: The University of Canterbury Approach
Teaching the practical aspects of device and chip design in New Zealand presents many problems, including high manufacturing costs, long lead times, and the lack of local industry...
Richard J. Blaikie, Maan M. Alkaisi, Steven M. Dur...
ICTAI
2002
IEEE
15 years 4 months ago
A Clustering Based Approach to Efficient Image Retrieval
This paper addresses the issue of effective and efficient content based image retrieval by presenting a novel indexing and retrieval methodology that integrates color, texture, an...
Ruofei Zhang, Zhongfei Zhang