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CEC
2005
IEEE
15 years 6 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
101
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GLOBECOM
2007
IEEE
15 years 6 months ago
2007
IEEE
—Network lifetime is a critical issue in Wireless Sensor Networks. It is possible to extend network lifetime by organizing the sensors into a number of sensor covers. However, wi...
113
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FORTE
2003
15 years 1 months ago
2003
The aim of passive testing is to detect faults in a system while observing the system during normal operation, that is, without forcing the system to specialized inputs explicitly ...
83
Voted
GECCO
2007
Springer
15 years 6 months ago
2007
Springer
There has been a considerable body of work on search–based test data generation for branch coverage. However, hitherto, there has been no work on multi–objective branch covera...
84
Voted
AICCSA
2006
IEEE
15 years 6 months ago
2006
IEEE
The problem of optimally deploying a heterogeneous set of sensing devices in environments with differential surveillance requirements is presented. The problem is formulated in th...