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176
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CEC
2005
IEEE
16 years 17 days ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
181
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CINQ
2004
Springer
15 years 10 months ago
2004
Springer
Abstract. Constrained graphs are directed graphs describing the control flow of processes models. In such graphs, nodes represent activities involved in the process, and edges the ...
172
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NIPS
1994
15 years 8 months ago
1994
We present a statistical method that PAC learns the class of stochastic perceptrons with arbitrary monotonic activation function and weights wi {-1, 0, +1} when the probability d...
217
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FUN
2010
Springer
15 years 11 months ago
2010
Springer
In countries such as China or Iran where Internet censorship is prevalent, users usually rely on proxies or anonymizers to freely access the web. The obvious difficulty with this a...
186
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CORR
2010
Springer
15 years 7 months ago
2010
Springer
Artificial neural networks (ANNs) have been successfully applied to solve a variety of classification and function approximation problems. Although ANNs can generally predict bett...