107 search results - page 6 / 22 » Active Fault Diagnosis Based on Stochastic Tests |
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
DFT
2003
IEEE
15 years 3 months ago
2003
IEEE
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
TSE
2010
14 years 8 months ago
2010
This paper presents an innovative model of a program’s internal behavior over a set of test inputs, called the probabilistic program dependence graph (PPDG), that facilitates pr...
COMPSAC
2008
IEEE
14 years 11 months ago
2008
IEEE
This paper presents a methodology for setting up a Decision Support system for User Interface Design (DSUID). We first motivate the role and contributions of DSUID and then demons...
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SIGSOFT
2010
ACM
14 years 4 months ago
2010
ACM
Although a number of automatic tools have been developed to detect faults, much of the diagnosis is still being done manually. To help with the diagnostic tasks, we formally intro...