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» Activity-driven clock design for low power circuits
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ATS
1998
IEEE
112views Hardware» more  ATS 1998»
15 years 6 months ago
Integrated Current Sensing Device for Micro IDDQ Test
A current sensing device, namely Hall Effect MOSFET (HEMOS) is proposed. It is experimentally shown that the HEMOS enables a non-contacting, and non-disturbing current measurement...
Koichi Nose, Takayasu Sakurai
111
Voted
CODES
2005
IEEE
15 years 7 months ago
Power-smart system-on-chip architecture for embedded cryptosystems
In embedded cryptosystems, sensitive information can leak via timing, power, and electromagnetic channels. We introduce a novel power-smart system-on-chip architecture that provid...
Radu Muresan, Haleh Vahedi, Y. Zhanrong, Stefano G...
DAC
2003
ACM
16 years 2 months ago
Seed encoding with LFSRs and cellular automata
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
Ahmad A. Al-Yamani, Edward J. McCluskey
ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
15 years 8 months ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson
117
Voted
DAC
1997
ACM
15 years 6 months ago
Transistor Sizing Issues and Tool For Multi-Threshold CMOS Technology
Multi-threshold CMOS is an increasingly popular circuit approach that enables high performance and low power operation. However, no methodologies have been developed to size the h...
James Kao, Anantha Chandrakasan, Dimitri Antoniadi...