21183 search results - page 187 / 4237 » Adaptive Testing by Test |
149
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ICECCS
2005
IEEE
15 years 12 months ago
2005
IEEE
For Model Driven Development approaches to succeed, there is a need for model validation techniques. This paper presents an approach to testing designs described by UML class diag...
116
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisi...
162
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
178
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DATE
2000
IEEE
15 years 10 months ago
2000
IEEE
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
222
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ICSM
1999
IEEE
15 years 10 months ago
1999
IEEE
Test case prioritization techniques schedule test cases for execution in an order that attempts to maximize some objective function. A variety of objective functions are applicabl...