21183 search results - page 3800 / 4237 » Adaptive Testing by Test |
147
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ICCD
2007
IEEE
16 years 3 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
177
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
Abstract— Power consumption has become a crucial problem in modern circuit design. Multiple Supply Voltage (MSV) design is introduced to provide higher flexibility in controllin...
168
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
We propose a post-placement physical synthesis algorithm that can apply multiple circuit synthesis and placement transforms on a placed circuit to improve the critical path delay ...
188
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
In order to handle device matching in analog circuits, some pairs of modules are required to be placed symmetrically. This paper addresses this device-level placement problem for ...
167
Voted
ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
With the advent of deep sub-micron (DSM) era, floorplanning has become increasingly important in physical design process. In this paper we clarify a misunderstanding in using Lag...