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» Adaptive Testing by Test

109

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GLVLSI
1998
IEEE

106views VLSI» more GLVLSI 1998»

Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling

15 years 9 months ago

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Irith Pomeranz, Sudhakar M. Reddy

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132

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HASE
1998
IEEE

128views Control Systems» more HASE 1998»

In-Parameter-Order: A Test Generation Strategy for Pairwise Testing

15 years 9 months ago

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Yu Lei, Kuo-Chung Tai

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119

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VTS
1996
IEEE

75views Hardware» more VTS 1996»

A new test pattern generation method for delay fault testing

15 years 9 months ago

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S. Cremoux, Christophe Fagot, Patrick Girard, Chri...

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112

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DAC
1992
ACM

93views Computer Architecture» more DAC 1992»

SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits

15 years 8 months ago

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Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer

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141

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ITC
1992
IEEE

93views Hardware» more ITC 1992»

Self-Test Scheduling with Bounded Test Execution

15 years 8 months ago

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