2451 search results - page 27 / 491 » Alternative Test Methods Using IEEE 1149.4 |
DSD
2010
IEEE
14 years 8 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
ICPR
2004
IEEE
15 years 11 months ago
2004
IEEE
We propose a hybrid face recognition method that combines holistic and feature analysis-based approaches using a Markov random field (MRF) model. The face images are divided into ...
WACV
2005
IEEE
15 years 3 months ago
2005
IEEE
In this paper we describe a novel method for gait based identity verification based on Bayesian classification. The verification task is reduced to a two class problem (Client or ...
ICPR
2002
IEEE
15 years 2 months ago
2002
IEEE
Testing for uniformity of multivariate data is the initial step in exploratory pattern analysis. We propose a new uniformity testing method, which first computes the maximum (sta...