Many modern enterprises are collecting data at the most detailed level possible, creating data repositories ranging from terabytes to petabytes in size. The ability to apply sophi...
Sudipto Das, Yannis Sismanis, Kevin S. Beyer, Rain...
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
The prerequisites of success and reasons for failure for enterprise integration projects are still not wellunderstood as evidenced by large failure rates, including cost or schedu...
Copyright 2004 IEEE. Published in Conference on Computer Vision and Pattern Recognition (CVPR-2004), June 27 - July 2, 2004, Washington DC. Personal use of this material is permit...
Because of the increasing complexity of products and the design process, as well as the popularity of computer-aided documentation tools, the number of electronic and textual desi...