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HASE
1998
IEEE
15 years 2 months ago
Estimating the Number of Residual Defects
Residual defects is one of the most important factors that allow one to decide if a piece of software is ready to be released. In theory, one can find all the defects and count th...
Yashwant K. Malaiya, Jason Denton
TIP
2008
193views more  TIP 2008»
14 years 9 months ago
Image Restoration Using Space-Variant Gaussian Scale Mixtures in Overcomplete Pyramids
In recent years Bayes Least Squares - Gaussian scale mixtures (BLS-GSM) has emerged as one of the most powerful methods for image restoration. Its strength relies on providing a si...
Jose A. Guerrero-Colon, Luis Mancera, Javier Porti...
DSN
2002
IEEE
15 years 2 months ago
On the Placement of Software Mechanisms for Detection of Data Errors
An important aspect in the development of dependable software is to decide where to locate mechanisms for efficient error detection and recovery. We present a comparison between ...
Martin Hiller, Arshad Jhumka, Neeraj Suri
BMCBI
2006
131views more  BMCBI 2006»
14 years 9 months ago
The statistics of identifying differentially expressed genes in Expresso and TM4: a comparison
Background: Analysis of DNA microarray data takes as input spot intensity measurements from scanner software and returns differential expression of genes between two conditions, t...
Allan A. Sioson, Shrinivasrao P. Mane, Pinghua Li,...
MM
2004
ACM
248views Multimedia» more  MM 2004»
15 years 3 months ago
Incremental semi-supervised subspace learning for image retrieval
Subspace learning techniques are widespread in pattern recognition research. They include Principal Component Analysis (PCA), Locality Preserving Projection (LPP), etc. These tech...
Xiaofei He