Dynamic programming, branch-and-bound, and constraint programming are the standard solution principles for nding optimal solutions to machine scheduling problems. We propose a new ...
This paper describes a systematic approach that facilitates yield improvement of integrated circuits at the post-manufacture stage. A new Configurable Analogue Transistor (CAT) st...
We propose an integrated framework for the design of SOC test solutions, which includes a set of algorithms for early design space exploration as well as extensive optimization for...
To meet users’ growing needs for accessing pre-existing heterogeneous databases, a multidatabase system (MDBS) integrating multiple databases has attracted many researchers recen...
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...