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CORR
2010
Springer
152views Education» more  CORR 2010»
14 years 7 months ago
Evolutionary Approach to Test Generation for Functional BIST
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
Y. A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, Raim...
SE
2010
14 years 11 months ago
Multi-Level Test Models for Embedded Systems
Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
Abel Marrero Pérez, Stefan Kaiser
ET
2002
90views more  ET 2002»
14 years 9 months ago
Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan M...
COMPSAC
2008
IEEE
15 years 4 months ago
An Adaptive Software Architecture Model Based on Component-Mismatches Detection and Elimination
Commercial-off-the-shelf components (COTS) are widely reused at present and black-box composition is the unique way to integrate them into the target system. However, various mism...
Shan Tang, Xin Peng, Yiming Lau, Wenyun Zhao, Zhix...
MBEES
2010
14 years 8 months ago
Test Case Integration: From Components to Systems
In a component-based development approach system integration generally implies the packaging and deployment of a group of software components on hardware units, possibly hiding th...
Bernhard Schätz, Christian Pfaller