5268 search results - page 973 / 1054 » Analysis of Design Process Dynamics |
147
Voted
DAC
2008
ACM
16 years 4 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
127
Voted
CHI
2006
ACM
16 years 3 months ago
2006
ACM
Many users are familiar with the interesting but limited functionality of Data Detector interfaces like Microsoft's Smart Tags and Google's AutoLink. In this paper we si...
130
Voted
ICCAD
2007
IEEE
16 years 11 days ago
2007
IEEE
— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...
136
Voted
SIGSOFT
2009
ACM
15 years 10 months ago
2009
ACM
Web-services are broadly considered as an effective means to achieve interoperability between heterogeneous parties of a business process and offer an open platform for developing...
142
Voted
IISWC
2009
IEEE
15 years 10 months ago
2009
IEEE
— Programming to exploit the resources in a multicore system remains a major obstacle for both computer and software engineers. Transactional memory offers an attractive alternat...