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» Application of deterministic logic BIST on industrial circui...
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ET
2002
122views more  ET 2002»
14 years 9 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter
ATS
2010
IEEE
250views Hardware» more  ATS 2010»
14 years 6 months ago
Efficient Embedding of Deterministic Test Data
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
Mudassar Majeed, Daniel Ahlstrom, Urban Ingelsson,...
ITC
1997
IEEE
80views Hardware» more  ITC 1997»
15 years 1 months ago
Scan Synthesis for One-Hot Signals
Tri-state buses and pass transistor logic are used in many complex applications to achieve high performance and small area. Such circuits often contain logic requiring one-hot sig...
Subhasish Mitra, LaNae J. Avra, Edward J. McCluske...
ICCD
2004
IEEE
128views Hardware» more  ICCD 2004»
15 years 6 months ago
Static Transition Probability Analysis Under Uncertainty
Deterministic gate delay models have been widely used to find the transition probabilities at the nodes of a circuit for calculating the power dissipation. However, with progress...
Siddharth Garg, Siddharth Tata, Ravishankar Arunac...
ISPD
1999
ACM
98views Hardware» more  ISPD 1999»
15 years 1 months ago
Towards synthetic benchmark circuits for evaluating timing-driven CAD tools
For the development and evaluation of CAD-tools for partitioning, floorplanning, placement, and routing of digital circuits, a huge amount of benchmark circuits with suitable cha...
Dirk Stroobandt, Peter Verplaetse, Jan Van Campenh...