5570 search results - page 118 / 1114 » Applications of Fair Testing |
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DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
133
Voted
PKC
1999
Springer
15 years 7 months ago
1999
Springer
Abstract. Many applications rely on the security of their random number generator. It is therefore essential that such devices be extensively tested for malfunction. The purpose of...
117
Voted
IPPS
2006
IEEE
15 years 9 months ago
2006
IEEE
In a network consisting of several thousands computers, the occurrence of faults is unavoidable. Being able to test the behaviour of a distributed program in an environment where ...
119
Voted
AHS
2007
IEEE
15 years 3 months ago
2007
IEEE
This paper is concerned with application of standard wireless COTS protocols to space. Suitability of commercially available wireless sensor mote kits for communication inside and...
115
Voted
VTS
2006
IEEE
15 years 9 months ago
2006
IEEE
This paper presents the design and experimental results of fully integrated CMOS power sensors for RF built-in self-test (BIST) applications. Using a standard 0.18- m CMOS process...