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130
Voted
VTS
2007
IEEE
103views Hardware» more  VTS 2007»
15 years 10 months ago
At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
Matthieu Tuna, Mounir Benabdenbi, Alain Greiner
125
Voted
EMSOFT
2005
Springer
15 years 9 months ago
Random testing of interrupt-driven software
Interrupt-driven embedded software is hard to thoroughly test since it usually contains a very large number of executable paths. Developers can test more of these paths using rand...
John Regehr
144
Voted
SAFECOMP
2005
Springer
15 years 9 months ago
Control and Data Flow Testing on Function Block Diagrams
As programmable logic controllers(PLCs) have been used in safety-critical applications, testing of PLC applications has become important. The previous PLC-based software testing te...
Eunkyoung Jee, Junbeom Yoo, Sung Deok Cha
150
Voted
KBSE
2002
IEEE
15 years 8 months ago
SeDiTeC - Testing Based on Sequence Diagrams
In this paper we present a concept for automated testing of object-oriented applications and a tool called SeDiTeC that implements these concepts for Java applications. SeDiTeC us...
Falk Fraikin, Thomas Leonhardt
DAC
2008
ACM
16 years 4 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...