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VTS
1997
IEEE
96views Hardware» more  VTS 1997»
15 years 8 months ago
Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
COMPSAC
2004
IEEE
15 years 7 months ago
Mutation-Based Testing Criteria for Timeliness
Temporal correctness is crucial to the dependability of real-time systems. Few methods exist to test for temporal correctness and most existing methods are ad-hoc. A problem with ...
Robert Nilsson, Jeff Offutt, Sten F. Andler
IJCAI
2007
15 years 5 months ago
Fault-Model-Based Test Generation for Embedded Software
Testing embedded software systems on the control units of vehicles is a safety-relevant task, and developing the test suites for performing the tests on test benches is time-consu...
Michael Esser, Peter Struss
ET
2002
105views more  ET 2002»
15 years 3 months ago
An Integrated Framework for the Design and Optimization of SOC Test Solutions
We propose an integrated framework for the design of SOC test solutions, which includes a set of algorithms for early design space exploration as well as extensive optimization for...
Erik Larsson, Zebo Peng
SAC
2008
ACM
15 years 3 months ago
PHALANX: a graph-theoretic framework for test case prioritization
Test case prioritization for regression testing can be performed using different metrics (e.g., statement coverage, path coverage) depending on the application context. Employing ...
Murali Krishna Ramanathan, Mehmet Koyutürk, A...