5570 search results - page 164 / 1114 » Applications of Fair Testing |
126
Voted
GLVLSI
2006
IEEE
15 years 9 months ago
2006
IEEE
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
119
Voted
CEC
2005
IEEE
15 years 9 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
145
Voted
SEFM
2005
IEEE
15 years 9 months ago
2005
IEEE
The development of test cases is an important issue for testing software, communication protocols and other reactive systems. A number of methods are known for the development of ...
119
Voted
APAQS
2000
IEEE
15 years 8 months ago
2000
IEEE
In the manufacturing domain, few new distributed systems are built ground-up; most contain wrapped legacy components. While the legacy components themselves are already well-teste...
122
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DATE
2000
IEEE
15 years 8 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...