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155
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ET
2002
122views more  ET 2002»
15 years 5 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter
158
Voted
TR
2010
159views Hardware» more  TR 2010»
15 years 1 days ago
Accelerated Degradation Tests Applied to Software Aging Experiments
Abstract--In the past ten years, the software aging phenomenon has been systematically researched, and recognized by both academic, and industry communities as an important obstacl...
Rivalino Matias, Pedro Alberto Barbetta, Kishor S....
CVPR
2008
IEEE
16 years 7 months ago
Order consistent change detection via fast statistical significance testing
Robustness to illumination variations is a key requirement for the problem of change detection which in turn is a fundamental building block for many visual surveillance applicati...
Maneesh Singh, Vasu Parameswaran, Visvanathan Rame...
IPPS
2003
IEEE
15 years 10 months ago
Distributed P2P Computing within Triana: A Galaxy Visualization Test Case
We discuss here a parallel implementation of the visualisation of data from a galaxy formation simulation within the Triana problem-solving environment. The visualisation is a tes...
Ian J. Taylor, Matthew S. Shields, Ian Wang, Roger...
ICMI
2003
Springer
150views Biometrics» more  ICMI 2003»
15 years 10 months ago
Capturing user tests in a multimodal, multidevice informal prototyping tool
Interaction designers are increasingly faced with the challenge of creating interfaces that incorporate multiple input modalities, such as pen and speech, and span multiple device...
Anoop K. Sinha, James A. Landay