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5570
search results - page 67 / 1114
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Applications of Fair Testing
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KBSE
1999
IEEE
107
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Software Engineering
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Automatic Generation of Test Oracles-From Pilot Studies to Application
15 years 7 months ago
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ase.cs.uni-essen.de
Martin S. Feather, Benjamin D. Smith
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97
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ITC
1998
IEEE
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Hardware
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ITC 1998
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An almost full-scan BIST solution-higher fault coverage and shorter test application time
15 years 7 months ago
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cadlab.ece.ucsb.edu
Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng
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102
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PODS
1996
ACM
87
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PODS 1996
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Testing Complex Temporal Relationships Involving Multiple Granularities and Its Application to Data Mining
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homes.dico.unimi.it
Claudio Bettini, Xiaoyang Sean Wang, Sushil Jajodi...
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108
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ICCAD
1993
IEEE
77
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ICCAD 1993
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Reconfigurable scan chains: a novel approach to reduce test application time
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poisson.usc.edu
Sridhar Narayanan, Melvin A. Breuer
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103
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ISSTA
1994
ACM
118
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Software Engineering
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ISSTA 1994
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Testing a Safety-Critical Application
15 years 7 months ago
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cs.union.edu
John C. Knight, Aaron G. Cass, Antonio M. Fern&aac...
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