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ICPR
2008
IEEE
15 years 8 months ago
A uniformity criterion and algorithm for data clustering
We propose a novel multivariate uniformity criterion for testing uniformity of point density in an arbitrary dimensional point pattern . An unsupervised, nonparametric data cluste...
Sanketh Shetty, Narendra Ahuja
ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
15 years 5 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
PAMI
2010
417views more  PAMI 2010»
14 years 12 months ago
Auto-Context and Its Application to High-Level Vision Tasks and 3D Brain Image Segmentation
The notion of using context information for solving high-level vision and medical image segmentation problems has been increasingly realized in the field. However, how to learn a...
Zhuowen Tu, Xiang Bai
JCB
2002
160views more  JCB 2002»
15 years 1 months ago
Inference from Clustering with Application to Gene-Expression Microarrays
There are many algorithms to cluster sample data points based on nearness or a similarity measure. Often the implication is that points in different clusters come from different u...
Edward R. Dougherty, Junior Barrera, Marcel Brun, ...
ISCA
2008
IEEE
89views Hardware» more  ISCA 2008»
15 years 8 months ago
Variation-Aware Application Scheduling and Power Management for Chip Multiprocessors
Within-die process variation causes individual cores in a Chip Multiprocessor (CMP) to differ substantially in both static power consumed and maximum frequency supported. In this ...
Radu Teodorescu, Josep Torrellas