We propose a novel multivariate uniformity criterion for testing uniformity of point density in an arbitrary dimensional point pattern . An unsupervised, nonparametric data cluste...
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
The notion of using context information for solving high-level vision and medical image segmentation problems has been increasingly realized in the field. However, how to learn a...
There are many algorithms to cluster sample data points based on nearness or a similarity measure. Often the implication is that points in different clusters come from different u...
Edward R. Dougherty, Junior Barrera, Marcel Brun, ...
Within-die process variation causes individual cores in a Chip Multiprocessor (CMP) to differ substantially in both static power consumed and maximum frequency supported. In this ...