1682 search results - page 330 / 337 » Applying Conventional Testing Techniques for Class Testing |
160
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ASPDAC
2005
ACM
15 years 11 months ago
2005
ACM
The progressive trend of fabrication technologies towards the nanometer regime has created a number of new physical design challenges for computer architects. Design complexity, u...
165
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SI3D
2005
ACM
15 years 11 months ago
2005
ACM
It is difficult to obtain a specific region within unsegmented volume data (region of interest, ROI). The user must first segment the volume, a task which itself involves signi...
166
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SOUPS
2005
ACM
15 years 11 months ago
2005
ACM
In this article, we describe the design process of Reno, a location-enhanced, mobile coordination tool and person finder. The design process included three field experiments: a ...
164
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ISPD
2004
ACM
15 years 11 months ago
2004
ACM
As the CMOS technology is scaled into the dimension of nanometer, the clock frequencies and die sizes of ICs are shown to be increasing steadily [5]. Today, global wires that requ...
144
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ISESE
2002
IEEE
15 years 10 months ago
2002
IEEE
The primary objective of this paper was to examine the extent to which Gutman’s Means-End Chain Model can be used to describe the influences given to the choice of characteristi...