1682 search results - page 330 / 337 » Applying Conventional Testing Techniques for Class Testing |
ASPDAC
2005
ACM
15 years 5 months ago
2005
ACM
The progressive trend of fabrication technologies towards the nanometer regime has created a number of new physical design challenges for computer architects. Design complexity, u...
SI3D
2005
ACM
15 years 5 months ago
2005
ACM
It is difficult to obtain a specific region within unsegmented volume data (region of interest, ROI). The user must first segment the volume, a task which itself involves signi...
108
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SOUPS
2005
ACM
15 years 5 months ago
2005
ACM
In this article, we describe the design process of Reno, a location-enhanced, mobile coordination tool and person finder. The design process included three field experiments: a ...
101
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ISPD
2004
ACM
15 years 5 months ago
2004
ACM
As the CMOS technology is scaled into the dimension of nanometer, the clock frequencies and die sizes of ICs are shown to be increasing steadily [5]. Today, global wires that requ...
ISESE
2002
IEEE
15 years 4 months ago
2002
IEEE
The primary objective of this paper was to examine the extent to which Gutman’s Means-End Chain Model can be used to describe the influences given to the choice of characteristi...