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» Applying Conventional Testing Techniques for Class Testing
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130
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IPPS
1998
IEEE
15 years 7 months ago
Meta-heuristics for Circuit Partitioning in Parallel Test Generation
In this communication Simulated Annealing and Genetic Algorithms, are applied to the graph partitioning problem. These techniques mimic processes in statistical mechanics and biol...
Consolación Gil, Julio Ortega, Antonio F. D...
143
Voted
FUIN
2007
147views more  FUIN 2007»
15 years 3 months ago
Privacy Preserving Database Generation for Database Application Testing
Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively few efforts ...
Xintao Wu, Yongge Wang, Songtao Guo, Yuliang Zheng
165
Voted
ICCV
2009
IEEE
15 years 1 months ago
Efficient multi-label ranking for multi-class learning: Application to object recognition
Multi-label learning is useful in visual object recognition when several objects are present in an image. Conventional approaches implement multi-label learning as a set of binary...
Serhat Selcuk Bucak, Pavan Kumar Mallapragada, Ron...
133
Voted
ICSEA
2007
IEEE
15 years 9 months ago
Test-Case Generation and Coverage Analysis for Nondeterministic Systems Using Model-Checkers
Abstract—Nondeterminism is used as a means of underspecification or implementation choice in specifications, and it is often necessary if part of a system or the environment is...
Gordon Fraser, Franz Wotawa
148
Voted
ASPDAC
2004
ACM
151views Hardware» more  ASPDAC 2004»
15 years 9 months ago
Combinatorial group testing methods for the BIST diagnosis problem
— We examine an abstract formulation of BIST diagnosis in digital logic systems. The BIST diagnosis problem has applications that include identification of erroneous test vector...
Andrew B. Kahng, Sherief Reda