4539 search results - page 192 / 908 » Approaches to Compute Workflow Complexity |
120
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ISPD
2000
ACM
15 years 8 months ago
2000
ACM
We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
155
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COMPGEOM
1997
ACM
15 years 8 months ago
1997
ACM
Abstract: We propose an e cient method that determines the sign of a multivariate polynomial expression with integer coe cients. This is a central operation on which the robustness...
128
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VIS
2007
IEEE
16 years 5 months ago
2007
IEEE
Abstract--The recently introduced notion of Finite-Time Lyapunov Exponent to characterize Coherent Lagrangian Structures provides a powerful framework for the visualization and ana...
133
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ICML
2007
IEEE
16 years 5 months ago
2007
IEEE
Given observed data and a collection of parameterized candidate models, a 1- confidence region in parameter space provides useful insight as to those models which are a good fit t...
133
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CCGRID
2009
IEEE
15 years 11 months ago
2009
IEEE
— As the scale and complexity of parallel systems continue to grow, failures become more and more an inevitable fact for solving large-scale applications. In this research, we pr...