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77
Voted
DAC
2007
ACM
16 years 3 days ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
DATE
2006
IEEE
15 years 5 months ago
2006
IEEE
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
DAC
2007
ACM
16 years 3 days ago
2007
ACM
Minimizing power consumption is vitally important in embedded system design; power consumption determines battery lifespan. Ultralow-power designs may even permit embedded systems...
103
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ICCAD
2002
IEEE
15 years 8 months ago
2002
IEEE
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...
161
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Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...