1414 search results - page 263 / 283 » Automated Metamorphic Testing |
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GIS
2006
ACM
16 years 24 days ago
2006
ACM
We present a novel method for the automatic generalization of land cover maps. A land cover map is composed of areas that collectively form a tessellation of the plane and each ar...
DAC
2009
ACM
16 years 23 days ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
DAC
2009
ACM
16 years 23 days ago
2009
ACM
Post-silicon processor debugging is frequently carried out in a loop consisting of several iterations of the following two key steps: (i) processor execution for some duration, fo...
DAC
2009
ACM
16 years 23 days ago
2009
ACM
This paper presents a technique to improve the storage density of spin-torque transfer (STT) magnetoresistive random access memory (MRAM) in the presence of significant magnetic t...
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DAC
2009
ACM
16 years 23 days ago
2009
ACM
Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem...