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» Automated Modeling of Custom Digital Circuits for Test
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DATE
1999
IEEE
194views Hardware» more  DATE 1999»
15 years 3 months ago
Algorithms for Solving Boolean Satisfiability in Combinational Circuits
Boolean Satisfiability is a ubiquitous modeling tool in Electronic Design Automation, It finds application in test pattern generation, delay-fault testing, combinational equivalen...
Luís Guerra e Silva, Luis Miguel Silveira, ...
IPPS
2007
IEEE
15 years 5 months ago
Speedup using Flowpaths for a Finite Difference Solution of a 3D Parabolic PDE
Partial differential equations (PDEs) are used to model physical phenomena and then appropriate convergent numerical algorithms are employed to solve them and create computer simu...
Darrin M. Hanna, Anna M. Spagnuolo, Michael DuChen...
DAC
2005
ACM
16 years 9 days ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
DAC
2000
ACM
16 years 9 days ago
Convex delay models for transistor sizing
This paper derives a methodology for developing accurate convex delay models to be used for transistor sizing. A new rich class of convex functions to model gate delay is presente...
Mahesh Ketkar, Kishore Kasamsetty, Sachin S. Sapat...
VTS
2000
IEEE
114views Hardware» more  VTS 2000»
15 years 3 months ago
Detection of CMOS Defects under Variable Processing Conditions
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
Amy Germida, James F. Plusquellic