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» Automatic Generation of Sigma-Protocols
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VLSID
1995
IEEE
112views VLSI» more  VLSID 1995»
15 years 9 months ago
An efficient automatic test generation system for path delay faults in combinational circuits
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
ITC
1994
IEEE
136views Hardware» more  ITC 1994»
15 years 9 months ago
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
FLAIRS
2008
15 years 8 months ago
Automatic Question Pattern Generation for Ontology-based Question Answering
Shiyan Ou, Constantin Orasan, Dalila Mekhaldi, Lau...