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52

ICCAD
1995
IEEE

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Design verification via simulation and automatic test pattern generation

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Design verification via simulation and automatic test pattern generation

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Hussain Al-Asaad, John P. Hayes

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Added	26 Aug 2010
Updated	26 Aug 2010
Type	Conference
Year	1995
Where	ICCAD
Authors	Hussain Al-Asaad, John P. Hayes

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