41 search results - page 2 / 9 » Automatic Generation of Synchronous Test Patterns for Asynch... |
116
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ICCAD
1997
IEEE
15 years 6 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
118
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VTS
1997
IEEE
15 years 6 months ago
1997
IEEE
We describe a technique to generate critical hazard-free tests for self-timed control circuits build using a macromodule library, in a partial scan based DFT environment. Wepropos...
ICCAD
2004
IEEE
15 years 10 months ago
2004
IEEE
ITC
1994
IEEE
15 years 5 months ago
1994
IEEE
97
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ICTAI
1994
IEEE
15 years 5 months ago
1994
IEEE