42 search results - page 6 / 9 » Automatic Test Pattern Generation for Resistive Bridging Fau... |
ET
2002
14 years 9 months ago
2002
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...
100
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ICCAD
1999
IEEE
15 years 1 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
EVOW
2001
Springer
15 years 1 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
ITC
1992
IEEE
15 years 1 months ago
1992
IEEE
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
101
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ISCAS
2007
IEEE
15 years 3 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...