302 search results - page 61 / 61 » Automatic Verification of Timed Circuits |
102
Voted
HPCA
2006
IEEE
15 years 10 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
107
Voted
DFT
2006
IEEE
15 years 3 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...