302 search results - page 61 / 61 » Automatic Verification of Timed Circuits |
155
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HPCA
2006
IEEE
16 years 4 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
172
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DFT
2006
IEEE
15 years 10 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...