New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
The development of correct OO distributed software is a daunting task as soon as the distributed interactions are not trivial. This is due to the inherent complexity of distribute...
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...