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ITC
2003
IEEE
114views Hardware» more  ITC 2003»
15 years 9 months ago
Test-Based Model Generation For Legacy Systems
We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes....
Hardi Hungar, Tiziana Margaria, Bernhard Steffen
ICCAD
2002
IEEE
146views Hardware» more  ICCAD 2002»
16 years 1 months ago
Test-model based hierarchical DFT synthesis
With increasing design sizes and adoption of System on a Chip (SoC) methodology, design synthesis and test automation tools are hitting capacity and performance bottlenecks. Curre...
Sanjay Ramnath, Frederic Neuveux, Mokhtar Hirech, ...
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ISOLA
2004
Springer
15 years 9 months ago
Case Studies with Lurette V2
Abstract. Lurette is an automated testing tool dedicated to reactive programs. The test process is automated at two levels: given a formal description of the System Under Test (SUT...
Erwan Jahier, Pascal Raymond, Philippe Baufreton
GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
15 years 10 months ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita
ISSTA
2000
ACM
15 years 8 months ago
Simplifying failure-inducing input
Given some test case, a program fails. Which part of the test case is responsible for the particular failure? We show how our delta debugging algorithm generalizes and simplifies...
Ralf Hildebrandt, Andreas Zeller