4166 search results - page 783 / 834 » Automating the constraining process |
DAC
2008
ACM
15 years 10 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Processing and storage of confidential or critical information is an every day occurrence in computing systems. The trustworthiness of computing devices has become an important co...
DAC
2000
ACM
15 years 10 months ago
2000
ACM
At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...
DAC
2000
ACM
15 years 10 months ago
2000
ACM
Recently, intellectual property protection (IPP) techniques attracted a great deal of attention from semiconductor, system integration and software companies. A number of watermar...
DAC
2001
ACM
15 years 10 months ago
2001
ACM
This paper presents the design and evaluation of an 8-bit adiabatic multiplier. Both the multiplier core and its built-in self-test logic have been designed using a true single-ph...