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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 8 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
SOFSEM
2007
Springer
15 years 10 months ago
Personalized Presentation in Web-Based Information Systems
Abstract. Large information spaces and complex functionality of contemporary systems together with the advent of the Semantic Web are big challenges for the design of simple yet po...
Michal Tvarozek, Michal Barla, Mária Bielik...
KI
2007
Springer
15 years 10 months ago
Bridging the Sense-Reasoning Gap Using DyKnow: A Knowledge Processing Middleware Framework
To achieve complex missions an autonomous unmanned aerial vehicle (UAV) operating in dynamic environments must have and maintain situational awareness. This can be achieved by cont...
Fredrik Heintz, Piotr Rudol, Patrick Doherty
ER
1994
Springer
121views Database» more  ER 1994»
15 years 8 months ago
An Executable Meta Model for Re-Engineering of Database Schemas
A logical database schema, e.g. a relational one, is an implementation of a speci cation, e.g. an entity-relationship diagram. Upcoming new data models and the necessity of seamle...
Manfred A. Jeusfeld, Uwe A. Johnen
AR
2005
138views more  AR 2005»
15 years 4 months ago
On actively closing loops in grid-based FastSLAM
Acquiring models of the environment belongs to the fundamental tasks of mobile robots. In the past, several researchers have focused on the problem of simultaneous localization an...
Cyrill Stachniss, Dirk Hähnel, Wolfram Burgar...