3281 search results - page 18 / 657 » Bases for parametrized iterativity |
DATE
2009
IEEE
15 years 6 months ago
2009
IEEE
DFT
2002
IEEE
15 years 4 months ago
2002
IEEE
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DAC
2010
ACM
15 years 6 hour ago
2010
ACM
With technology scaling down to 90nm and below, many yield-driven design and optimization methodologies have been proposed to cope with the prominent process variation and to incr...
ICASSP
2010
IEEE
14 years 12 months ago
2010
IEEE
ICDAR
2007
IEEE
14 years 12 months ago
2007
IEEE
