—Analysis and modeling of wireless networks greatly depend on understanding the structure of underlying mobile nodes. In this paper we present two clustering algorithms to determ...
Yung-Chih Chen, Elisha J. Rosensweig, Jim Kurose, ...
We describe and test a software approach to overcoming radiation-induced errors in spaceborne applications running on commercial off-the-shelf components. The approach uses checks...
A 25k gate Test Chip was designed and manufactured to evaluate different test methods for scan-designed circuits. The design of the chip, the experiment, and preliminary experimen...
Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin...
Automated Visual Inspection (AVI) is an essential part in the manufacturing process of Integrated Circuit (IC) packages. Contamination a common defect type found in IC packages ap...
Abstract— Today’s middleware applications tend to be complicated, and consist of tiers that form a nested chain of objects or processes. For a real-time nested application, pre...