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TCAD
2008
88views more  TCAD 2008»
14 years 11 months ago
Self-Adaptive Data Caches for Soft-Error Reliability
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches' dominant share in die area and tr...
Shuai Wang, Jie S. Hu, Sotirios G. Ziavras
TEC
2008
100views more  TEC 2008»
14 years 11 months ago
Real-Valued Compact Genetic Algorithms for Embedded Microcontroller Optimization
Recent research on compact genetic algorithms (cGAs) has proposed a number of evolutionary search methods with reduced memory requirements. In cGAs, the evolution of populations is...
Ernesto Mininno, Francesco Cupertino, David Naso
JAR
2007
97views more  JAR 2007»
14 years 11 months ago
Debugging Incoherent Terminologies
Abstract. In this paper we study the diagnosis and repair of incoherent terminologies. We define a number of new non-standard reasoning services to explain incoherence through pin...
Stefan Schlobach, Zhisheng Huang, Ronald Cornet, F...
TCAD
1998
91views more  TCAD 1998»
14 years 11 months ago
Cost-free scan: a low-overhead scan path design
Conventional scan design imposes considerable area and delay overhead by using larger scan ip- ops and additional scan wires without utilizing the functionality of the combinatio...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Mike Ti...
TISSEC
2002
75views more  TISSEC 2002»
14 years 11 months ago
Termination in language-based systems
Language runtime systems are increasingly being embedded in systems to support runtime extensibility via mobile code. Such systems raise a number of concerns when the code running...
Algis Rudys, Dan S. Wallach